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Replacement signal access wire for MultiMode application modules
In mechanical applications
Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm
25mm diameter DESCRIPTION
The latest addition to the cost effective FASTSCAN probe series is the FASTSCAN-D
STOR2 25 nm Replacement signal access wire forTip storage kit with gel for silicon nitride cantilevers DESCRIPTION Tip storage kit with gel for silicon nitride cantilevers. This tip storage kit provides convenient storage for individual tips from whole wafers. Includes one sheet of adhesive Gel Pak (6" x 6", grade 0, high tack) and 20 plastic boxes with hinged cover.
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