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Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM and PeakForce TUNA modes
Thickness: PELCO® Grids are approximately 25µm thick
1mm windows
Hole Width 90µm
The specimen viewing area is created by etching away a window in the silicon substrate
Tap150GB-G Select Quantity:50 per set Bruker Atomic Force Microscopy groupGold Coated and Soft Tapping Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Soft Tapping Mode AFM Probe Monolithic silicon AFM probe for soft tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Not
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