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Gold substrate layer thickness: 50nm (±5nm)
If repositioning is required
Silver content >60% by weight
08mm 5749 DUMONT High Precision N4 108mm NM-SS 0
ScanAsyst Fluid+ probes marry the sharpness of a Silicon tip with the low spring constant and high sensitivity of a Silicon Nitride cantilever
Triangular Test Grating for X- or Y-axis Select:Test grating TGT-1500, 3µm pitch, unmounted Gold substrate layer thickness: 50nmDESCRIPTION The TGT 1500 test grating is intended for SPM calibration in X or Y axis, determination of lateral and vertical scanner nonlinearity, detection of angular distortion and tip characterization. Nominal values for height and pitch are given below. Actual values come with the test grating. Structure: Si wafer with grating in top surface Pattern type: 1 D array of triangular steps with precise linear and angular dimensions Edge angle:
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