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-- Included in the new MM-SCM-V3 Scanning Capacitance Microscopy solution for MultiMode
the tobacco mosaic virus is undamaged by blunt tips but is compressed or disintegrated under sharper scanning styli
where the specifications are met through tight manufacturing tolerances and not by individual per die measurements
PtIr Conductive Coating
Recommended for use with Bruker Dimension FastScan AFM
Test Grating for Tip Sharpness Hysitron -- Included in the newDESCRIPTION The TGTZ 400 test grating is intended for 3 D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: 10nm Tip Height: 0. 3 0. 7m Period: 3 0. 01m Diagonal period: 2. 12m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 2 x 2mm
