SiNi 120mm This quartz material is well

This quartz material is well documented and used in many microscopy applications

the supploed sample modulus is nominal and may change with sample aging

Intended to be used with FESEM at higher magnifications

5029-4-T Replacement Ceramic Tips for 5029-4 - 1 pair

fine tips 5A 115mm NM-SS 0

SiNi 120mm This quartz material is wellSilicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip This competitively priced silicon nitride AFM probe features: 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip silicon nitride wedge