enabling imaging of the fragile biological samples without deforming the samples’ fundamental atomic structures
Imaging in both secondary and back scattered mode is very high
50 and 500µm pitch patterns and X & Y Micro-ruler
5KHZ DESCRIPTION
Heater/cooler fluid cell kit DESCRIPTION
SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards 15 nm enabling imaging of the fragileDESCRIPTION MRS 4 Reference Standard, X, Not Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y Z, Traceable, without Protective Retainer, Unmounted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron